interference fringe
英 [ˌɪntəˈfɪərəns frɪndʒ]
美 [ˌɪntərˈfɪrəns frɪndʒ]
干扰带；干扰边纹；（光波）干涉条纹
英英释义
noun
- one of the light or dark bands produced by the interference and diffraction of light
双语例句
- When this instrument is applied to detecting incident laser, through refining the interference fringe extracted from interferogram, the wavelength and incident angle of incident laser can be calculated.
应用这种仪器探测入射激光，对采集的干涉图进行条纹提取和细化后，可推算出入射激光的波长和入射角。 - Thermal Refractive Index Coefficients of Colorless Optical Glass and Equal Thickness Interference Fringe of Optical Flat
无色光学玻璃折射率温度系数与平晶等厚干涉条纹 - The software of experiment system includes: interference fringe processing system, and the output of measuring results. We emphasize the method and principle for interference fringe processing, and some arithmetic in point. Then, we compile the software.
软件部分主要包括干涉图处理系统和测量结果的输出，本文着重介绍了干涉条纹图处理的方法和原理，以及相关的算法，并完成了软件的编写。 - Analysis and application of strainght interference fringe of Michelson interferometer fringe counting laser interferometer manometer
迈克耳逊干涉仪的干涉图样中干涉直条纹的分析与利用条纹计数式激光干涉压力计 - A simple device for measuring laser interference fringe visual acuity of retina-brain system of the human eye is introduced.
本文介绍了一种测定人眼激光视网膜干涉条纹视力的简易装置。 - Study of Fine Structure of Interference Fringe on Diffraction Pattern by Filament
细丝衍射图样中干涉条纹精细结构的研究 - Fourier transformation is used to grating analysis. The quantitative results of surface deformation and surface wave have been calculated from the interference fringe patterns.
应用Fourier变换方法对实验结果进行计算和分析，得到了流体表面变形和表面波的定量的实验结果。 - Visibility is a measurement of the clarity of interference fringe.
可见度是对干涉条纹清晰程度的度量。 - On the basis of structure design of optical system and parameter option of optical components, the visibility of interference fringe with zero background intensity is optimized.
通过对光学干涉系统结构设计和元件参数选择，最大限度地优化了干涉条纹的可见度，并设计出零背景光强标准硅球直径精密测量系统。 - In practical application, it can be extended to be used in interference fringe measure-ment optical element unevenness and optical surface detection.
在实际应用上，可推广到光学中干涉条纹的测量及各种光学元件不平度和光学表面的检测。